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Echternacht, Gary – 1985
This paper outlines a methodology that school districts can use to enhance the presentation of district-wide testing program results to administrators, school boards, teachers, and the public. Based on John Tukey's two way analysis methodology, it involves fitting this model: test score equals overall plus year plus grade plus cohort plus…
Descriptors: Data Analysis, Effect Size, Elementary Secondary Education, Mathematical Models
Reckase, Mark D. – 1977
Latent trait model calibration procedures were used on data obtained from a group testing program. The one-parameter model of Wright and Panchapakesan and the three-parameter logistic model of Wingersky, Wood, and Lord were selected for comparison. These models and their corresponding estimation procedures were compared, using actual and simulated…
Descriptors: Achievement Tests, Adaptive Testing, Aptitude Tests, Comparative Analysis
Hill, Richard K. – 1979
Four problems faced by the staff of the California Assessment Program (CAP) were solved by applying Rasch scaling techniques: (1) item cultural bias in the Entry Level Test (ELT) given to all first grade pupils; (2) nonlinear regression analysis of the third grade Reading Test scores; (3) comparison of school growth from grades two to three, using…
Descriptors: Black Students, Cultural Differences, Data Analysis, Difficulty Level