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Direct linkLi, Jie; van der Linden, Wim J. – Journal of Educational Measurement, 2018
The final step of the typical process of developing educational and psychological tests is to place the selected test items in a formatted form. The step involves the grouping and ordering of the items to meet a variety of formatting constraints. As this activity tends to be time-intensive, the use of mixed-integer programming (MIP) has been…
Descriptors: Programming, Automation, Test Items, Test Format
Diao, Qi; van der Linden, Wim J. – Applied Psychological Measurement, 2013
Automated test assembly uses the methodology of mixed integer programming to select an optimal set of items from an item bank. Automated test-form generation uses the same methodology to optimally order the items and format the test form. From an optimization point of view, production of fully formatted test forms directly from the item pool using…
Descriptors: Automation, Test Construction, Test Format, Item Banks
van der Linden, Wim J.; Diao, Qi – Journal of Educational Measurement, 2011
In automated test assembly (ATA), the methodology of mixed-integer programming is used to select test items from an item bank to meet the specifications for a desired test form and optimize its measurement accuracy. The same methodology can be used to automate the formatting of the set of selected items into the actual test form. Three different…
Descriptors: Test Items, Test Format, Test Construction, Item Banks
Download full textvan der Linden, Wim J. – 2001
This report contains a review of procedures for computerized assembly of linear, sequential, and adaptive tests. The common approach to these test assembly problems is to view them as instances of constrained combinatorial optimization. For each testing format, several potentially useful objective functions and types of constraints are discussed.…
Descriptors: Adaptive Testing, Computer Assisted Testing, Test Construction, Test Format
van der Linden, Wim J. – 1999
A constrained computerized adaptive testing (CAT) algorithm is presented that automatically equates the number-correct scores on adaptive tests. The algorithm can be used to equate number-correct scores across different administrations of the same adaptive test as well as to an external reference test. The constraints are derived from a set of…
Descriptors: Ability, Adaptive Testing, Algorithms, Computer Assisted Testing
van der Linden, Wim J. – Applied Psychological Measurement, 2006
Two local methods for observed-score equating are applied to the problem of equating an adaptive test to a linear test. In an empirical study, the methods were evaluated against a method based on the test characteristic function (TCF) of the linear test and traditional equipercentile equating applied to the ability estimates on the adaptive test…
Descriptors: Adaptive Testing, Computer Assisted Testing, Test Format, Equated Scores
