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Kim, Sooyeon; Moses, Tim; Yoo, Hanwook Henry – ETS Research Report Series, 2015
The purpose of this inquiry was to investigate the effectiveness of item response theory (IRT) proficiency estimators in terms of estimation bias and error under multistage testing (MST). We chose a 2-stage MST design in which 1 adaptation to the examinees' ability levels takes place. It includes 4 modules (1 at Stage 1, 3 at Stage 2) and 3 paths…
Descriptors: Item Response Theory, Computation, Statistical Bias, Error of Measurement
Yan, Duanli; Almond, Russell; Mislevy, Robert – ETS Research Report Series, 2004
Diagnostic score reports linking assessment outcomes to instructional interventions are one of the most requested features of assessment products. There is a body of interesting work done in the last 20 years including Tatsuoka's rule space method (Tatsuoka, 1983), Haertal and Wiley's binary skills model (Haertal, 1984; Haertal & Wiley, 1993),…
Descriptors: Comparative Analysis, Models, Bayesian Statistics, Statistical Inference
Johnson, Matthew S.; Jenkins, Frank – ETS Research Report Series, 2005
Large-scale educational assessments such as the National Assessment of Educational Progress (NAEP) sample examinees to whom an exam will be administered. In most situations the sampling design is not a simple random sample and must be accounted for in the estimating model. After reviewing the current operational estimation procedure for NAEP, this…
Descriptors: Bayesian Statistics, Hierarchical Linear Modeling, National Competency Tests, Sampling
Sinharay, Sandip; Johnson, Matthew – ETS Research Report Series, 2005
"Item models" (LaDuca, Staples, Templeton, & Holzman, 1986) are classes from which it is possible to generate/produce items that are equivalent/isomorphic to other items from the same model (e.g., Bejar, 1996; Bejar, 2002). They have the potential to produce large number of high-quality items at reduced cost. This paper introduces…
Descriptors: Item Analysis, Test Items, Scoring, Psychometrics
Sinharay, Sandip – ETS Research Report Series, 2004
Assessing fit of psychometric models has always been an issue of enormous interest, but there exists no unanimously agreed upon item fit diagnostic for the models. Bayesian networks, frequently used in educational assessments (see, for example, Mislevy, Almond, Yan, & Steinberg, 2001) primarily for learning about students' knowledge and…
Descriptors: Bayesian Statistics, Networks, Models, Goodness of Fit

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