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| Career Development | 1 |
| Classification | 1 |
| Mastery Tests | 1 |
| Test Length | 1 |
| Test Reliability | 1 |
| Test Theory | 1 |
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| Psychometrika | 1 |
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| Huynh, Huynh | 1 |
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| Journal Articles | 1 |
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Peer reviewedHuynh, Huynh – Psychometrika, 1978
The use of Cohen's kappa index as a measure of the reliability of multiple classifications is developed. Special cases of the index as well as the effects of test length on the index are also explored. (JKS)
Descriptors: Career Development, Classification, Mastery Tests, Test Length
