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Controlling Test Overlap Rate in Automated Assembly of Multiple Equivalent Test Forms
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Lin, Chuan-Ju – Journal of Technology, Learning, and Assessment, 2010
Assembling equivalent test forms with minimal test overlap across forms is important in ensuring test security. Chen and Lei (2009) suggested a exposure control technique to control test overlap-ordered item pooling on the fly based on the essence that test overlap rate--ordered item pooling for the first t examinees is a function of test overlap…
Descriptors: Test Length, Test Format, Evaluation Criteria, Psychometrics
Comparisons between Classical Test Theory and Item Response Theory in Automated Assembly of Parallel Test Forms
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Lin, Chuan-Ju – Journal of Technology, Learning, and Assessment, 2008
The automated assembly of alternate test forms for online delivery provides an alternative to computer-administered, fixed test forms, or computerized-adaptive tests when a testing program migrates from paper/pencil testing to computer-based testing. The weighted deviations model (WDM) heuristic particularly promising for automated test assembly…
Descriptors: Item Response Theory, Test Theory, Comparative Analysis, Computer Assisted Testing