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Park, Seohee; Kim, Kyung Yong; Lee, Won-Chan – Journal of Educational Measurement, 2023
Multiple measures, such as multiple content domains or multiple types of performance, are used in various testing programs to classify examinees for screening or selection. Despite the popular usages of multiple measures, there is little research on classification consistency and accuracy of multiple measures. Accordingly, this study introduces an…
Descriptors: Testing, Computation, Classification, Accuracy
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Wolkowitz, Amanda A. – Journal of Educational Measurement, 2021
Decision consistency (DC) is the reliability of a classification decision based on a test score. In professional credentialing, the decision is often a high-stakes pass/fail decision. The current methods for estimating DC are computationally complex. The purpose of this research is to provide a computationally and conceptually simple method for…
Descriptors: Decision Making, Reliability, Classification, Scores
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Wang, Wenyi; Song, Lihong; Chen, Ping; Meng, Yaru; Ding, Shuliang – Journal of Educational Measurement, 2015
Classification consistency and accuracy are viewed as important indicators for evaluating the reliability and validity of classification results in cognitive diagnostic assessment (CDA). Pattern-level classification consistency and accuracy indices were introduced by Cui, Gierl, and Chang. However, the indices at the attribute level have not yet…
Descriptors: Classification, Reliability, Accuracy, Cognitive Tests
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Lathrop, Quinn N.; Cheng, Ying – Journal of Educational Measurement, 2014
When cut scores for classifications occur on the total score scale, popular methods for estimating classification accuracy (CA) and classification consistency (CC) require assumptions about a parametric form of the test scores or about a parametric response model, such as item response theory (IRT). This article develops an approach to estimate CA…
Descriptors: Cutting Scores, Classification, Computation, Nonparametric Statistics
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Rutkowski, Leslie; Zhou, Yan – Journal of Educational Measurement, 2015
Given the importance of large-scale assessments to educational policy conversations, it is critical that subpopulation achievement is estimated reliably and with sufficient precision. Despite this importance, biased subpopulation estimates have been found to occur when variables in the conditioning model side of a latent regression model contain…
Descriptors: Error of Measurement, Error Correction, Regression (Statistics), Computation
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Cui, Ying; Gierl, Mark J.; Chang, Hua-Hua – Journal of Educational Measurement, 2012
This article introduces procedures for the computation and asymptotic statistical inference for classification consistency and accuracy indices specifically designed for cognitive diagnostic assessments. The new classification indices can be used as important indicators of the reliability and validity of classification results produced by…
Descriptors: Classification, Accuracy, Cognitive Tests, Diagnostic Tests
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Jiao, Hong; Kamata, Akihito; Wang, Shudong; Jin, Ying – Journal of Educational Measurement, 2012
The applications of item response theory (IRT) models assume local item independence and that examinees are independent of each other. When a representative sample for psychometric analysis is selected using a cluster sampling method in a testlet-based assessment, both local item dependence and local person dependence are likely to be induced.…
Descriptors: Item Response Theory, Test Items, Markov Processes, Monte Carlo Methods
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de la Torre, Jimmy; Hong, Yuan; Deng, Weiling – Journal of Educational Measurement, 2010
To better understand the statistical properties of the deterministic inputs, noisy "and" gate cognitive diagnosis (DINA) model, the impact of several factors on the quality of the item parameter estimates and classification accuracy was investigated. Results of the simulation study indicate that the fully Bayes approach is most accurate when the…
Descriptors: Classification, Computation, Models, Simulation
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Wolfe, Jack M. – Journal of Educational Measurement, 1971
Descriptors: Classification, Computation, Correlation, Nonparametric Statistics