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Rodeck, Elaine M.; Chin, Tzu-Yun; Davis, Susan L.; Plake, Barbara S. – Journal of Applied Testing Technology, 2008
This study examined the relationships between the evaluations obtained from standard setting panelists and changes in ratings between different rounds of a standard setting study that involved setting standards on different language versions of an exam. We investigated panelists' evaluations to determine if their perceptions of the standard…
Descriptors: Mathematics Tests, Standard Setting (Scoring), French, Evaluation Research
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Ferrara, Steve; Perie, Marianne; Johnson, Eugene – Journal of Applied Testing Technology, 2008
Psychometricians continue to introduce new approaches to setting cut scores for educational assessments in an attempt to improve on current methods. In this paper we describe the Item-Descriptor (ID) Matching method, a method based on IRT item mapping. In ID Matching, test content area experts match items (i.e., their judgments about the knowledge…
Descriptors: Test Results, Test Content, Testing Programs, Educational Testing