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Educational and Psychological… | 6 |
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Wilcox, Rand R. | 2 |
Albanese, Mark A. | 1 |
Feldt, Leonard S. | 1 |
Forsyth, Robert A. | 1 |
Rudner, Lawrence M. | 1 |
Werts, C. E. | 1 |
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Wilcox, Rand R. – Educational and Psychological Measurement, 1982
Results in the engineering literature on "k out of n system reliability" can be used to characterize tests based on estimates of the probability of correctly determining whether the examinee knows the correct response. In particular, the minimum number of distractors required for multiple-choice tests can be empirically determined.…
Descriptors: Achievement Tests, Mathematical Models, Multiple Choice Tests, Test Format

Wilcox, Rand R. – Educational and Psychological Measurement, 1979
Wilcox has described three probability models which characterize a single test item in terms of a population of examinees (ED 156 718). This note indicates indicates that similar models can be derived which characterize a single examinee in terms of an item domain. A numerical illustration is given. (Author/JKS)
Descriptors: Achievement Tests, Item Analysis, Mathematical Models, Probability

Rudner, Lawrence M. – Educational and Psychological Measurement, 1983
The relationship between item parameter values obtained from independent Birnbaum (l968) model calibrations of the same item set from two different samples is examined. (Author)
Descriptors: Achievement Tests, Aptitude Tests, Item Analysis, Latent Trait Theory

Feldt, Leonard S. – Educational and Psychological Measurement, 1984
The binomial error model includes form-to-form difficulty differences as error variance and leads to Ruder-Richardson formula 21 as an estimate of reliability. If the form-to-form component is removed from the estimate of error variance, the binomial model leads to KR 20 as the reliability estimate. (Author/BW)
Descriptors: Achievement Tests, Difficulty Level, Error of Measurement, Mathematical Formulas

Werts, C. E.; And Others – Educational and Psychological Measurement, 1977
A simplex model is presented for the analysis of longitudinal academic growth variables in which only one measure is obtained at each time. When this model fits the observed data, then reliabilities and unattenuated correlations can be estimated except for the first and last periods. (Author)
Descriptors: Academic Achievement, Achievement Gains, Achievement Tests, Elementary Secondary Education

Albanese, Mark A.; Forsyth, Robert A. – Educational and Psychological Measurement, 1984
The purpose of this study was to compare the relative robustness of the one-, two-, and modified two-parameter latent trait logistic models for the Iowa Tests of Educational Development. Results suggest that the modified two-parameter model may provide the best representation of the data. (Author/BW)
Descriptors: Achievement Tests, Comparative Analysis, Goodness of Fit, Item Analysis