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| Reliability | 2 |
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| Computer Assisted Testing | 1 |
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| Goodness of Fit | 1 |
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| Applied Psychological… | 2 |
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Peer reviewedSanders, Piet F.; Verschoor, Alfred J. – Applied Psychological Measurement, 1998
Presents minimization and maximization models for parallel test construction under constraints. The minimization model constructs weakly and strongly parallel tests of minimum length, while the maximization model constructs weakly and strongly parallel tests with maximum test reliability. (Author/SLD)
Descriptors: Algorithms, Models, Reliability, Test Construction
Peer reviewedLuecht, Richard M.; Hirsch, Thomas M. – Applied Psychological Measurement, 1992
Derivations of several item selection algorithms for use in fitting test items to target information functions (IFs) are described. These algorithms, which use an average growth approximation of target IFs, were tested by generating six test forms and were found to provide reliable fit. (SLD)
Descriptors: Algorithms, Computer Assisted Testing, Equations (Mathematics), Goodness of Fit
