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Tendeiro, Jorge N.; Meijer, Rob R. – Applied Psychological Measurement, 2013
To classify an item score pattern as not fitting a nonparametric item response theory (NIRT) model, the probability of exceedance (PE) of an observed response vector x can be determined as the sum of the probabilities of all response vectors that are, at most, as likely as x, conditional on the test's total score. Vector x is to be considered…
Descriptors: Probability, Nonparametric Statistics, Goodness of Fit, Test Length
Nandakumar, Ratna; Yu, Feng; Zhang, Yanwei – Applied Psychological Measurement, 2011
DETECT is a nonparametric methodology to identify the dimensional structure underlying test data. The associated DETECT index, "D[subscript max]," denotes the degree of multidimensionality in data. Conditional covariances (CCOV) are the building blocks of this index. In specifying population CCOVs, the latent test composite [theta][subscript TT]…
Descriptors: Nonparametric Statistics, Statistical Analysis, Tests, Data
Cui, Zhongmin; Kolen, Michael J. – Applied Psychological Measurement, 2008
This article considers two methods of estimating standard errors of equipercentile equating: the parametric bootstrap method and the nonparametric bootstrap method. Using a simulation study, these two methods are compared under three sample sizes (300, 1,000, and 3,000), for two test content areas (the Iowa Tests of Basic Skills Maps and Diagrams…
Descriptors: Test Length, Test Content, Simulation, Computation
Peer reviewedCliff, Norman; And Others – Applied Psychological Measurement, 1979
Monte Carlo research with TAILOR, a program using implied orders as a basis for tailored testing, is reported. TAILOR typically required about half the available items to estimate, for each simulated examinee, the responses on the remainder. (Author/CTM)
Descriptors: Adaptive Testing, Computer Programs, Item Sampling, Nonparametric Statistics
Peer reviewedMeijer, Rob R.; And Others – Applied Psychological Measurement, 1994
The power of the nonparametric person-fit statistic, U3, is investigated through simulations as a function of item characteristics, test characteristics, person characteristics, and the group to which examinees belong. Results suggest conditions under which relatively short tests can be used for person-fit analysis. (SLD)
Descriptors: Difficulty Level, Group Membership, Item Response Theory, Nonparametric Statistics

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