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Shaojie Wang; Won-Chan Lee; Minqiang Zhang; Lixin Yuan – Applied Measurement in Education, 2024
To reduce the impact of parameter estimation errors on IRT linking results, recent work introduced two information-weighted characteristic curve methods for dichotomous items. These two methods showed outstanding performance in both simulation and pseudo-form pseudo-group analysis. The current study expands upon the concept of information…
Descriptors: Item Response Theory, Test Format, Test Length, Error of Measurement
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Lim, Euijin; Lee, Won-Chan – Applied Measurement in Education, 2020
The purpose of this study is to address the necessity of subscore equating and to evaluate the performance of various equating methods for subtests. Assuming the random groups design and number-correct scoring, this paper analyzed real data and simulated data with four study factors including test dimensionality, subtest length, form difference in…
Descriptors: Equated Scores, Test Length, Test Format, Difficulty Level
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Chon, Kyong Hee; Lee, Won-Chan; Ansley, Timothy N. – Applied Measurement in Education, 2013
Empirical information regarding performance of model-fit procedures has been a persistent need in measurement practice. Statistical procedures for evaluating item fit were applied to real test examples that consist of both dichotomously and polytomously scored items. The item fit statistics used in this study included the PARSCALE's G[squared],…
Descriptors: Test Format, Test Items, Item Analysis, Goodness of Fit
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Feldt, Leonard S. – Applied Measurement in Education, 2002
Considers the degree of bias in testlet-based alpha (internal consistency reliability) through hypothetical examples and real test data from four tests of the Iowa Tests of Basic Skills. Presents a simple formula for computing a testlet-based congeneric coefficient. (SLD)
Descriptors: Estimation (Mathematics), Reliability, Statistical Bias, Test Format
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Qualls, Audrey L. – Applied Measurement in Education, 1995
Classically parallel, tau-equivalently parallel, and congenerically parallel models representing various degrees of part-test parallelism and their appropriateness for tests composed of multiple item formats are discussed. An appropriate reliability estimate for a test with multiple item formats is presented and illustrated. (SLD)
Descriptors: Achievement Tests, Estimation (Mathematics), Measurement Techniques, Test Format