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| Applied Measurement in… | 1 |
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| Wise, Steven L. | 1 |
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Wise, Steven L.; Kong, Xiaojing – Applied Measurement in Education, 2005
When low-stakes assessments are administered, the degree to which examinees give their best effort is often unclear, complicating the validity and interpretation of the resulting test scores. This study introduces a new method, based on item response time, for measuring examinee test-taking effort on computer-based test items. This measure, termed…
Descriptors: Psychometrics, Validity, Reaction Time, Test Items

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