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Direct linkSauder, Derek; DeMars, Christine – Applied Measurement in Education, 2020
We used simulation techniques to assess the item-level and familywise Type I error control and power of an IRT item-fit statistic, the "S-X"[superscript 2]. Previous research indicated that the "S-X"[superscript 2] has good Type I error control and decent power, but no previous research examined familywise Type I error control.…
Descriptors: Item Response Theory, Test Items, Sample Size, Test Length
