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Direct linkChon, Kyong Hee; Lee, Won-Chan; Ansley, Timothy N. – Applied Measurement in Education, 2013
Empirical information regarding performance of model-fit procedures has been a persistent need in measurement practice. Statistical procedures for evaluating item fit were applied to real test examples that consist of both dichotomously and polytomously scored items. The item fit statistics used in this study included the PARSCALE's G[squared],…
Descriptors: Test Format, Test Items, Item Analysis, Goodness of Fit
Peer reviewedFeldt, Leonard S. – Applied Measurement in Education, 2002
Considers the degree of bias in testlet-based alpha (internal consistency reliability) through hypothetical examples and real test data from four tests of the Iowa Tests of Basic Skills. Presents a simple formula for computing a testlet-based congeneric coefficient. (SLD)
Descriptors: Estimation (Mathematics), Reliability, Statistical Bias, Test Format
