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Cui, Ying; Leighton, Jacqueline P. – Journal of Educational Measurement, 2009
In this article, we introduce a person-fit statistic called the hierarchy consistency index (HCI) to help detect misfitting item response vectors for tests developed and analyzed based on a cognitive model. The HCI ranges from -1.0 to 1.0, with values close to -1.0 indicating that students respond unexpectedly or differently from the responses…
Descriptors: Test Length, Simulation, Correlation, Research Methodology
van der Linden, Wim J. – Evaluation in Education: International Progress, 1982
In mastery testing a linear relationship between an optimal passing score and test length is presented with a new optimization criterion. The usual indifference zone approach, a binomial error model, decision errors, and corrections for guessing are discussed. Related results in sequential testing and the latent class approach are included. (CM)
Descriptors: Cutting Scores, Educational Testing, Mastery Tests, Mathematical Models
Peer reviewedDeville, Craig; O'Neill, Thomas; Wright, Benjamin D.; Woodcock, Richard W.; Munoz-Sandoval, Ana; Gershon, Richard C.; Bergstrom, Betty – Popular Measurement, 1998
Articles in this special section consider (1) flow in test taking (Craig Deville); (2) testwiseness (Thomas O'Neill); (3) test length (Benjamin Wright); (4) cross-language test equating (Richard W. Woodcock and Ana Munoz-Sandoval); (5) computer-assisted testing and testwiseness (Richard Gershon and Betty Bergstrom); and (6) Web-enhanced testing…
Descriptors: Computer Assisted Testing, Educational Testing, Equated Scores, Measurement Techniques
Wainer, Howard; Thissen, David – 1994
When an examination consists in whole or part of constructed response test items, it is common practice to allow the examinee to choose a subset of the constructed response questions from a larger pool. It is sometimes argued that, if choice were not allowed, the limitations on domain coverage forced by the small number of items might unfairly…
Descriptors: Constructed Response, Difficulty Level, Educational Testing, Equated Scores

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