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Joo, Seang-Hwane; Lee, Philseok – Journal of Educational Measurement, 2022
Abstract This study proposes a new Bayesian differential item functioning (DIF) detection method using posterior predictive model checking (PPMC). Item fit measures including infit, outfit, observed score distribution (OSD), and Q1 were considered as discrepancy statistics for the PPMC DIF methods. The performance of the PPMC DIF method was…
Descriptors: Test Items, Bayesian Statistics, Monte Carlo Methods, Prediction
Nguyen, Huy; Liew, Chun Wai – International Educational Data Mining Society, 2018
Recent works on Intelligent Tutoring Systems have focused on more complicated knowledge domains, which pose challenges in automated assessment of student performance. In particular, while the system can log every user action and keep track of the student's solution state, it is unable to determine the hidden intermediate steps leading to such…
Descriptors: Bayesian Statistics, Intelligent Tutoring Systems, Data Analysis, Error Patterns
Schochet, Peter Z.; Chiang, Hanley S. – National Center for Education Evaluation and Regional Assistance, 2010
This paper addresses likely error rates for measuring teacher and school performance in the upper elementary grades using value-added models applied to student test score gain data. Using realistic performance measurement system schemes based on hypothesis testing, we develop error rate formulas based on OLS and Empirical Bayes estimators.…
Descriptors: Teacher Effectiveness, Teacher Evaluation, Student Evaluation, Scores
An Alternative Estimator for the Maximum Likelihood Estimator for the Two Extreme Response Patterns.
Samejima, Fumiko – 1981
In the methods and approaches developed for estimating the operating characteristics of the discrete item responses, the maximum likelihood estimate of the examinee based upon the "Old Test" has an important role. When Old Test does not provide a sufficient amount of test information for the upper and lower part of the ability interval,…
Descriptors: Academic Ability, Adaptive Testing, Bayesian Statistics, Error Patterns

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