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van der Linden, Wim J.; Ren, Hao – Journal of Educational and Behavioral Statistics, 2020
The Bayesian way of accounting for the effects of error in the ability and item parameters in adaptive testing is through the joint posterior distribution of all parameters. An optimized Markov chain Monte Carlo algorithm for adaptive testing is presented, which samples this distribution in real time to score the examinee's ability and optimally…
Descriptors: Bayesian Statistics, Adaptive Testing, Error of Measurement, Markov Processes
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Cappaert, Kevin J.; Wen, Yao; Chang, Yu-Feng – Measurement: Interdisciplinary Research and Perspectives, 2018
Events such as curriculum changes or practice effects can lead to item parameter drift (IPD) in computer adaptive testing (CAT). The current investigation introduced a point- and weight-adjusted D[superscript 2] method for IPD detection for use in a CAT environment when items are suspected of drifting across test administrations. Type I error and…
Descriptors: Adaptive Testing, Computer Assisted Testing, Test Items, Identification
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Bradlow, Eric T. – Journal of Educational and Behavioral Statistics, 1996
The three-parameter logistic (3-PL) model is described and a derivation of the 3-PL observed information function is presented for a single binary response from one examinee with known item parameters. Formulas are presented for the probability of negative information and for the expected information (always nonnegative). (SLD)
Descriptors: Ability, Adaptive Testing, Computer Assisted Testing, Item Response Theory
Zwick, Rebecca – 1995
This paper describes a study, now in progress, of new methods for representing the sampling variability of Mantel-Haenszel differential item functioning (DIF) results, based on the system for categorizing the severity of DIF that is now in place at the Educational Testing Service. The methods, which involve a Bayesian elaboration of procedures…
Descriptors: Adaptive Testing, Bayesian Statistics, Classification, Computer Assisted Testing