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| Algorithms | 3 |
| Computer Assisted Testing | 2 |
| Test Construction | 2 |
| Adaptive Testing | 1 |
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| Applied Psychological… | 3 |
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| Leucht, Richard M. | 1 |
| Sanders, Piet F. | 1 |
| Schnipke, Deborah L. | 1 |
| Scrams, David J. | 1 |
| Verschoor, Alfred J. | 1 |
| van der Linden, Wim J. | 1 |
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| Journal Articles | 3 |
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Peer reviewedLeucht, Richard M. – Applied Psychological Measurement, 1998
Presents a variation of a "greedy" algorithm that can be used in test-assembly problems. The algorithm, the normalized weighted absolute-deviation heuristic, selects items to have a locally optimal fit to a moving set of average criterion values. Demonstrates application of the model. (SLD)
Descriptors: Algorithms, Computer Assisted Testing, Criteria, Heuristics
Peer reviewedSanders, Piet F.; Verschoor, Alfred J. – Applied Psychological Measurement, 1998
Presents minimization and maximization models for parallel test construction under constraints. The minimization model constructs weakly and strongly parallel tests of minimum length, while the maximization model constructs weakly and strongly parallel tests with maximum test reliability. (Author/SLD)
Descriptors: Algorithms, Models, Reliability, Test Construction
Peer reviewedvan der Linden, Wim J.; Scrams, David J.; Schnipke, Deborah L. – Applied Psychological Measurement, 1999
Proposes an item-selection algorithm for neutralizing the differential effects of time limits on computerized adaptive test scores. Uses a statistical model for distributions of examinees' response times on items in a bank that is updated each time an item is administered. Demonstrates the method using an item bank from the Armed Services…
Descriptors: Adaptive Testing, Algorithms, Computer Assisted Testing, Item Banks
