ERIC - Search Results

Descriptor

Academic Achievement	1
Academic Aptitude	1
Background	1
Disadvantaged Youth	1
Educationally Disadvantaged	1
Intelligence	1
Intelligence Differences	1
Intelligence Tests	1
Predictive Validity	1
Special Education	1
Test Bias	1
Test Reliability	1
Test Results	1
More ▼

Source

Educational Forum

Author

Vandivier, Phillip L.	1
Vandivier, Stella Sue	1

Publication Type

Journal Articles	1
Opinion Papers	1

Education Level

Audience

Location

Laws, Policies, & Programs

Assessments and Surveys

Stanford Binet Intelligence…	1
Wechsler Intelligence Scale…	1

What Works Clearinghouse Rating

Showing one result Save | Export

A "Nonbiased Assessment" of Intelligence Testing.

Peer reviewed

Vandivier, Phillip L.; Vandivier, Stella Sue – Educational Forum, 1979

Discusses the most widely used individual intelligence tests: Wechsler Intelligence Scale for Children (WISC) and Stanford-Binet Intelligence Scale (Form L-M). Covers what the tests measure; psychometric or technical properties of the tests; and how test results are used. (JOW)

Descriptors: Academic Achievement, Academic Aptitude, Background, Disadvantaged Youth