Publication Date
| In 2025 | 0 |
| Since 2024 | 0 |
| Since 2021 (last 5 years) | 0 |
| Since 2016 (last 10 years) | 0 |
| Since 2006 (last 20 years) | 1 |
Descriptor
Source
| ETS Research Report Series | 1 |
Author
| Fu, Jianbin | 1 |
| Wise, Maxwell | 1 |
Publication Type
| Numerical/Quantitative Data | 3 |
| Reports - Descriptive | 2 |
| Journal Articles | 1 |
| Reports - Research | 1 |
Education Level
| Elementary Education | 1 |
| Grade 7 | 1 |
| Grade 8 | 1 |
| Junior High Schools | 1 |
| Middle Schools | 1 |
| Secondary Education | 1 |
Audience
| Policymakers | 2 |
Location
Laws, Policies, & Programs
| Pell Grant Program | 2 |
Assessments and Surveys
What Works Clearinghouse Rating
Peer reviewed
Download full textFu, Jianbin; Wise, Maxwell – ETS Research Report Series, 2012
In the Cognitively Based Assessment of, for, and as Learning ("CBAL"™) research initiative, innovative K-12 prototype tests based on cognitive competency models are developed. This report presents the statistical results of the 2 CBAL Grade 8 writing tests and 2 Grade 7 reading tests administered to students in 20 states in spring 2011.…
Descriptors: Cognitive Ability, Grade 8, Writing Tests, Grade 7
Advanced Technology, Inc., Reston, VA. – 1984
The development of the error prone model (EPM) for the 1984-1985 student financial aid validation criteria for Pell Grant recipient selection is discussed, based on a comparison of the 1983-1984 EPM criteria and a newly estimated EPM. Procedures/assumptions on which the new EPM was based include: a sample of 1982-1983 Pell Grant recipients…
Descriptors: Comparative Analysis, Dependents, Error Patterns, Evaluation Criteria
Advanced Technology, Inc., Reston, VA. – 1982
The development of a number of error-prone models to select Pell Grant recipients for validation is discussed. The 1983-1984 Pell Grant validation strategy consists of a two-stage approach: selection using Pre-Established Criteria (PEC) followed by selection using Error Prone Modeling (EPM). The database used for model development consists of a…
Descriptors: Comparative Analysis, Cost Effectiveness, Dependents, Error Patterns
