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Peer reviewedGustafsson, Jan-Eric – Journal of Educational Measurement, 1979
Computer generated data are used to show that Slinde and Linn's criticism of the usefulness of the Rasch model for equating (EJ 189 585) may have been the result of an artifact produced by the manner in which the samples were chosen in their study. (CTM)
Descriptors: Achievement Tests, Bias, College Entrance Examinations, Equated Scores
Download full textRentz, R. Robert; Rentz, Charlotte C. – 1978
Issues of concern to test developers interested in applying the Rasch model are discussed. The current state of the art, recommendations for use of the model, further needs, and controversies are described for the three stages of test construction: (1) definition of the content of the test and item writing; (2) item analysis; and (3) test…
Descriptors: Ability, Achievement Tests, Difficulty Level, Goodness of Fit
