Descriptor
| Equated Scores | 1 |
| Latent Trait Theory | 1 |
| Maximum Likelihood Statistics | 1 |
| Statistical Analysis | 1 |
| Test Reliability | 1 |
| Test Theory | 1 |
| Testing Problems | 1 |
Source
| Applied Psychological… | 1 |
Author
| Weiss, David J., Ed. | 1 |
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| Collected Works - Serials | 1 |
| Journal Articles | 1 |
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Peer reviewedWeiss, David J., Ed. – Applied Psychological Measurement, 1987
Issues concerning equating test scores are discussed in an introduction, four papers, and two commentaries. Equating methods research, sampling errors, linear equating, population differences, sources of equating errors, and a circular equating paradigm are considered. (SLD)
Descriptors: Equated Scores, Latent Trait Theory, Maximum Likelihood Statistics, Statistical Analysis
