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Direct linkHuang, Hung-Yu; Wang, Wen-Chung – Educational and Psychological Measurement, 2013
Both testlet design and hierarchical latent traits are fairly common in educational and psychological measurements. This study aimed to develop a new class of higher order testlet response models that consider both local item dependence within testlets and a hierarchy of latent traits. Due to high dimensionality, the authors adopted the Bayesian…
Descriptors: Item Response Theory, Models, Bayesian Statistics, Computation
Wu, Huey-Min; Kuo, Bor-Chen; Yang, Jinn-Min – Educational Technology & Society, 2012
In recent years, many computerized test systems have been developed for diagnosing students' learning profiles. Nevertheless, it remains a challenging issue to find an adaptive testing algorithm to both shorten testing time and precisely diagnose the knowledge status of students. In order to find a suitable algorithm, four adaptive testing…
Descriptors: Adaptive Testing, Test Items, Computer Assisted Testing, Mathematics
