Publication Date
In 2025 | 0 |
Since 2024 | 0 |
Since 2021 (last 5 years) | 0 |
Since 2016 (last 10 years) | 0 |
Since 2006 (last 20 years) | 1 |
Descriptor
Source
Author
Kelderman, Henk | 3 |
Evers, Arne | 2 |
Alderson, J. Charles | 1 |
Beguin, A. A. | 1 |
Beuk, Cees H. | 1 |
Elbers, Ed | 1 |
Falk, Barbara | 1 |
Helbing, J. C. | 1 |
Jochems, Wim | 1 |
Kelderman, Andrea | 1 |
Kreeft, Henk | 1 |
More ▼ |
Publication Type
Journal Articles | 13 |
Reports - Evaluative | 11 |
Speeches/Meeting Papers | 10 |
Reports - Descriptive | 7 |
Reports - Research | 6 |
Information Analyses | 2 |
Collected Works - Proceedings | 1 |
Opinion Papers | 1 |
Reports - General | 1 |
Education Level
Secondary Education | 1 |
Audience
Researchers | 2 |
Practitioners | 1 |
Teachers | 1 |
Location
Netherlands | 26 |
Nepal | 1 |
Sri Lanka | 1 |
Sweden | 1 |
Turkey | 1 |
United Kingdom (England) | 1 |
United Kingdom (Northern… | 1 |
United Kingdom (Wales) | 1 |
West Germany | 1 |
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating
van Rijn, P. W.; Beguin, A. A.; Verstralen, H. H. F. M. – Assessment in Education: Principles, Policy & Practice, 2012
While measurement precision is relatively easy to establish for single tests and assessments, it is much more difficult to determine for decision making with multiple tests on different subjects. This latter is the situation in the system of final examinations for secondary education in the Netherlands and is used as an example in this paper. This…
Descriptors: Secondary Education, Tests, Foreign Countries, Decision Making

Alderson, J. Charles; Wall, Dianne – Applied Linguistics, 1993
The notion of washback, that testing influences teaching, is explored and a series of possible hypotheses are advanced. The empirical research in general education and in language education is reviewed to determine whether washback actually exists, how it can be measured, and what accounts for its form. Proposals for future research are suggested.…
Descriptors: Foreign Countries, Language Tests, Teaching Methods, Test Coaching

Evers, Arne – International Journal of Testing, 2001
Describes the Dutch rating system for test quality, which evaluates a test for seven criteria, and analyses the results of test ratings from the past 18 years. Results show a steady increase in test quality in the Netherlands that can be attributed to use of better tests and declining use of tests of less quality after evaluation. (SLD)
Descriptors: Criteria, Educational Testing, Evaluation Methods, Foreign Countries

Evers, Arne – International Journal of Testing, 2001
Describes the 1997 revision of the Dutch Rating System for Test Quality used by a committee of the Dutch Association of Psychologists. The rating system evaluates test quality on seven criteria using a checklist for each criterion. Comment sections provide additional information, and weighting rules establish the final grades. (SLD)
Descriptors: Criteria, Educational Testing, Evaluation Methods, Foreign Countries

Beuk, Cees H. – Journal of Educational Measurement, 1984
A systematic method for compromise between absolute and relative examination standards is proposed. The passing score is assumed to be related to expected pass rate through a simple linear function. Results define a function relating the percentage of successful candidates given a specified passing score to the passing score. (Author/DWH)
Descriptors: Achievement Tests, Cutting Scores, Foreign Countries, Mathematical Models

van der Linden, Wim J. – Review of Educational Research, 1981
Using criterion-referenced test item data collected in an empirical study, differences in item selection between Cox and Vargas' pretest-posttest validity index and a latent trait approach (evaluation of the item information function for the mastery score) are analyzed. (Author/GK)
Descriptors: Comparative Analysis, Criterion Referenced Tests, Foreign Countries, Latent Trait Theory

Maas-de Brouwer, T. A. – Studies in Educational Evaluation, 1986
The use of reporting final examinations in the Netherlands is described. Each October a public report is published by Cito, supplying information about the achieved level of education and describing observed psychometric qualities of the measurement instrument. General information needs are provided by the National Bureau of Statistics. (LMO)
Descriptors: Data Interpretation, Educational Assessment, Foreign Countries, Information Needs

Van Krieken, Robert – Studies in Educational Evaluation, 1987
Marking is described as part of the central examinations for secondary general education in the Netherlands. These consist of two components: an external, and an internal school-based examination. Pedadogical implications of general school assessment practice, plus recent trends, are discussed. (BS)
Descriptors: Educational Testing, Educational Trends, Foreign Countries, Grading
Helbing, J. C. – 1974
Although this report is several years old, it explores test development in another country, specifically the Netherlands, using American-developed and normed-instruments. The development of vocational maturity tests and the adaptation of Crites' Vocational Developmental Inventory (VDI), Super's Career Development Inventory (CDI) and Westbrook's…
Descriptors: Career Development, Cultural Differences, Foreign Countries, High School Students
Kelderman, Henk – 1986
A method is proposed for the detection of item bias with respect to observed or unobserved subgroups. The method uses quasi-loglinear models for the incomplete subgroup x test score x item 1 x ... x item k contingency table. If the subgroup membership is unknown, the models are the incomplete-latent-class models of S. J. Haberman (1979). The…
Descriptors: Foreign Countries, Higher Education, Latent Trait Theory, Mathematical Models
Kelderman, Henk; Macready, George B. – 1988
The use of loglinear latent class models to detect item bias was studied. Purposes of the study were to: (1) develop procedures for use in assessing item bias when the grouping variable with respect to which bias occurs is not observed; (2) develop bias detection procedures that relate to a conceptually different assessed trait--a categorical…
Descriptors: Foreign Countries, Higher Education, Latent Trait Theory, Mathematical Models

Elbers, Ed; Kelderman, Andrea – European Journal of Psychology of Education, 1994
Contends that young children have little experience in answering test questions and misunderstandings easily arise when they are subjected to tests. Reports on a study of the impact of testing expectations on 110 Dutch primary school students. Finds that clear explanations about the testing situation leads to better performance. (CFR)
Descriptors: Elementary Education, Foreign Countries, Student Attitudes, Student Evaluation
Nienhuis, L. J. A.; van Weeren, J. – Etudes de Linguistique Appliquee, 1979
Discusses predictive and conceptual validity, reports on two experiments on each type of test validity with relation to language tests, and indicates some problems posed by these two forms of evaluation. (AM)
Descriptors: Correlation, Educational Research, Language Tests, Listening Comprehension

van der Ven, A. H. G. S.; And Others – Applied Psychological Measurement, 1989
A new model is presented that explains reaction time fluctuations in prolonged work tasks. The model extends the so-called Poisson-Erlang model and accounts for long-term trend effects in the reaction time curve. The model is consistent with Spearman's hypothesis that inhibition increases during work and decreases during rest. (TJH)
Descriptors: Elementary Secondary Education, Equations (Mathematics), Foreign Countries, Goodness of Fit

Thio, Djien K. – Educational Measurement: Issues and Practice, 1994
The growth of educational testing in the Netherlands is reviewed, and the way tests are used in elementary and secondary education is described. Educational testing in the Netherlands has been strongly connected to the existence of the National Institute for Educational Measurement (CITO). (SLD)
Descriptors: Economic Factors, Educational History, Educational Testing, Educational Trends
Previous Page | Next Page ยป
Pages: 1 | 2