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Imelu G. Mordeno; Queeneh T. Piape; Art Guilleane R. Roño; Wendel Ann C. Abejar; Michelle Anne L. Ferolino; Norman B. Mendoza – Journal of Psychoeducational Assessment, 2024
The Kessler Psychological Distress Scale (K-10) is widely utilized to assess non-specific psychological distress. However, when applied to COVID-19 pandemic experiences, its psychometric properties have not been examined. This study investigated the factor structure, reliability, and latent profile of K-10 using data from 3032 Filipino teachers…
Descriptors: COVID-19, Profiles, Pandemics, Psychological Patterns
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Ranger, Jochen; Kuhn, Jörg Tobias; Ortner, Tuulia M. – Educational and Psychological Measurement, 2020
The hierarchical model of van der Linden is the most popular model for responses and response times in tests. It is composed of two separate submodels--one for the responses and one for the response times--that are joined at a higher level. The submodel for the response times is based on the lognormal distribution. The lognormal distribution is a…
Descriptors: Reaction Time, Tests, Statistical Distributions, Models
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Ranger, Jochen; Kuhn, Jorg-Tobias – Applied Psychological Measurement, 2012
Research findings indicate that response times in personality scales are related to the trait level according to the so-called speed-distance hypothesis. Against this background, Ferrando and Lorenzo-Seva proposed a latent trait model for the responses and response times in a test. The model consists of two components, a standard item response…
Descriptors: Reaction Time, Item Response Theory, Models, Psychological Testing
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Feng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating