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Rutkowski, Leslie – Applied Measurement in Education, 2014
Large-scale assessment programs such as the National Assessment of Educational Progress (NAEP), Trends in International Mathematics and Science Study (TIMSS), and Programme for International Student Assessment (PISA) use a sophisticated assessment administration design called matrix sampling that minimizes the testing burden on individual…
Descriptors: Measurement, Testing, Item Sampling, Computation
Lockwood, J. R.; McCaffrey, Daniel F. – Grantee Submission, 2015
Regression, weighting and related approaches to estimating a population mean from a sample with nonrandom missing data often rely on the assumption that conditional on covariates, observed samples can be treated as random. Standard methods using this assumption generally will fail to yield consistent estimators when covariates are measured with…
Descriptors: Simulation, Computation, Statistical Analysis, Statistical Bias
Murphy, Daniel L.; Beretvas, S. Natasha – Applied Measurement in Education, 2015
This study examines the use of cross-classified random effects models (CCrem) and cross-classified multiple membership random effects models (CCMMrem) to model rater bias and estimate teacher effectiveness. Effect estimates are compared using CTT versus item response theory (IRT) scaling methods and three models (i.e., conventional multilevel…
Descriptors: Teacher Effectiveness, Comparative Analysis, Hierarchical Linear Modeling, Test Theory
Kelchen, Robert; Goldrick-Rab, Sara – Journal of Higher Education, 2015
The persistently low college attainment rates of youth from poor families are partly attributable to their uncertainty about college affordability. The current federal financial aid system does not provide specific information about college costs until just before college enrollment and the information is only available to students completing a…
Descriptors: Cost Effectiveness, Input Output Analysis, Federal Aid, Student Loan Programs
Huang, Hung-Yu; Wang, Wen-Chung – Educational and Psychological Measurement, 2013
Both testlet design and hierarchical latent traits are fairly common in educational and psychological measurements. This study aimed to develop a new class of higher order testlet response models that consider both local item dependence within testlets and a hierarchy of latent traits. Due to high dimensionality, the authors adopted the Bayesian…
Descriptors: Item Response Theory, Models, Bayesian Statistics, Computation
Huang, Hung-Yu; Wang, Wen-Chung; Chen, Po-Hsi; Su, Chi-Ming – Applied Psychological Measurement, 2013
Many latent traits in the human sciences have a hierarchical structure. This study aimed to develop a new class of higher order item response theory models for hierarchical latent traits that are flexible in accommodating both dichotomous and polytomous items, to estimate both item and person parameters jointly, to allow users to specify…
Descriptors: Item Response Theory, Models, Vertical Organization, Bayesian Statistics
Diaconu, Dana V. – ProQuest LLC, 2012
There is a broad interest in narrowing achievement gaps among all groups of students and improving education by scientifically sound methods. On October 25, 2006, the United States Department of Education published new regulations allowing single-sex education in public schools whenever schools think it will improve student achievement. Thus far,…
Descriptors: Foreign Countries, Achievement Gap, Public Schools, Effect Size
Lockwood, J. R.; McCaffrey, Daniel F. – National Center on Performance Incentives, 2008
This paper develops a model for longitudinal student achievement data designed to estimate heterogeneity in teacher effects across students of different achievement levels. The model specifies interactions between teacher effects and students' predicted scores on a test, estimating both average effects of individual teachers and interaction terms…
Descriptors: Classes (Groups of Students), Computation, Academic Achievement, Longitudinal Studies
Johnson, Matthew S.; Jenkins, Frank – ETS Research Report Series, 2005
Large-scale educational assessments such as the National Assessment of Educational Progress (NAEP) sample examinees to whom an exam will be administered. In most situations the sampling design is not a simple random sample and must be accounted for in the estimating model. After reviewing the current operational estimation procedure for NAEP, this…
Descriptors: Bayesian Statistics, Hierarchical Linear Modeling, National Competency Tests, Sampling