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Liu, Ru-De; Ding, Yi; Xu, Le; Wang, Jia – Journal of Educational Research, 2017
The authors' aim was to examine the relation between two-digit mental multiplication and working memory. In Study 1, involving 30 fifth-grade students, we used digit span backward as an abbreviated measure of working memory. In Study 2, involving 41 fourth-grade students, working memory comprised measures of phonological loop, visuospatial…
Descriptors: Short Term Memory, Mental Computation, Multiplication, Elementary School Students
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Murphy, Daniel L.; Beretvas, S. Natasha – Applied Measurement in Education, 2015
This study examines the use of cross-classified random effects models (CCrem) and cross-classified multiple membership random effects models (CCMMrem) to model rater bias and estimate teacher effectiveness. Effect estimates are compared using CTT versus item response theory (IRT) scaling methods and three models (i.e., conventional multilevel…
Descriptors: Teacher Effectiveness, Comparative Analysis, Hierarchical Linear Modeling, Test Theory
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Stuit, David; Austin, Megan J.; Berends, Mark; Gerdeman, R. Dean – Regional Educational Laboratory Midwest, 2014
Recent changes to state laws on accountability have prompted school districts to design teacher performance evaluation systems that incorporate student achievement (student growth) as a major component. As a consequence, some states and districts are considering teacher value-added models as part of teacher performance evaluations. Value-added…
Descriptors: Norm Referenced Tests, Criterion Referenced Tests, Teacher Effectiveness, Reading Achievement
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Huang, Hung-Yu; Wang, Wen-Chung – Educational and Psychological Measurement, 2014
In the social sciences, latent traits often have a hierarchical structure, and data can be sampled from multiple levels. Both hierarchical latent traits and multilevel data can occur simultaneously. In this study, we developed a general class of item response theory models to accommodate both hierarchical latent traits and multilevel data. The…
Descriptors: Item Response Theory, Hierarchical Linear Modeling, Computation, Test Reliability