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Kogar, Esin Yilmaz; Kelecioglu, Hülya – Journal of Education and Learning, 2017
The purpose of this research is to first estimate the item and ability parameters and the standard error values related to those parameters obtained from Unidimensional Item Response Theory (UIRT), bifactor (BIF) and Testlet Response Theory models (TRT) in the tests including testlets, when the number of testlets, number of independent items, and…
Descriptors: Item Response Theory, Models, Mathematics Tests, Test Items
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van Rijn, Peter W.; Sinharay, Sandip; Haberman, Shelby J.; Johnson, Matthew S. – Large-scale Assessments in Education, 2016
Latent regression models are used for score-reporting purposes in large-scale educational survey assessments such as the National Assessment of Educational Progress (NAEP) and Trends in International Mathematics and Science Study (TIMSS). One component of these models is based on item response theory. While there exists some research on assessment…
Descriptors: Goodness of Fit, Item Response Theory, Regression (Statistics), National Competency Tests
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Hauser, Carl; Thum, Yeow Meng; He, Wei; Ma, Lingling – Educational and Psychological Measurement, 2015
When conducting item reviews, analysts evaluate an array of statistical and graphical information to assess the fit of a field test (FT) item to an item response theory model. The process can be tedious, particularly when the number of human reviews (HR) to be completed is large. Furthermore, such a process leads to decisions that are susceptible…
Descriptors: Test Items, Item Response Theory, Research Methodology, Decision Making
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Frame, Laura B.; Vidrine, Stephanie M.; Hinojosa, Ryan – Journal of Psychoeducational Assessment, 2016
The Kaufman Test of Educational Achievement, Third Edition (KTEA-3) is a revised and updated comprehensive academic achievement test (Kaufman & Kaufman, 2014). Authored by Drs. Alan and Nadeen Kaufman and published by Pearson, the KTEA-3 remains an individual achievement test normed for individuals of ages 4 through 25 years, or for those in…
Descriptors: Achievement Tests, Elementary Secondary Education, Test Validity, Test Reliability