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Assessment of Fit of Item Response Theory Models Used in Large-Scale Educational Survey Assessments
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van Rijn, Peter W.; Sinharay, Sandip; Haberman, Shelby J.; Johnson, Matthew S. – Large-scale Assessments in Education, 2016
Latent regression models are used for score-reporting purposes in large-scale educational survey assessments such as the National Assessment of Educational Progress (NAEP) and Trends in International Mathematics and Science Study (TIMSS). One component of these models is based on item response theory. While there exists some research on assessment…
Descriptors: Goodness of Fit, Item Response Theory, Regression (Statistics), National Competency Tests
Digest of Education Statistics, 2012. NCES 2014-015 [Appendix A: Guide to Sources; Appendix B: Definitions; Appendix C: Index of Table Numbers]
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Snyder, Thomas D.; Dillow, Sally A. – National Center for Education Statistics, 2013
The 2012 edition of the "Digest of Education Statistics" is the 48th in a series of publications initiated in 1962. The "Digest" has been issued annually except for combined editions for the years 1977-78, 1983-84, and 1985-86. Its primary purpose is to provide a compilation of statistical information covering the broad field…
Descriptors: School Statistics, Definitions, Tables (Data), Longitudinal Studies
Digest of Education Statistics, 2011. NCES 2012-001 [Appendix A: Guide to Sources; Appendix B: Definitions; Appendix C: Index of Table Numbers]
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Snyder, Thomas D.; Dillow, Sally A. – National Center for Education Statistics, 2012
The 2011 edition of the "Digest of Education Statistics" is the 47th in a series of publications initiated in 1962. The "Digest" has been issued annually except for combined editions for the years 1977-78, 1983-84, and 1985-86. Its primary purpose is to provide a compilation of statistical information covering the broad field…
Descriptors: Educational Research, Data Collection, Data Analysis, Error Patterns