An Empirical Bayes Approach to Mantel-Haenszel DIF Analysis.

Zwick, Rebecca; Thayer, Dorothy T.; Lewis, Charles

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Peer reviewed

ERIC Number: EJ590611

Record Type: Journal

Publication Date: 1999

Pages: N/A

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ISSN: ISSN-0022-0655

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An Empirical Bayes Approach to Mantel-Haenszel DIF Analysis.

Zwick, Rebecca; Thayer, Dorothy T.; Lewis, Charles

Journal of Educational Measurement, v36 n1 p1-28 Spr 1999

Developed an empirical Bayes enhancement to Mantel-Haenszel (MH) analysis of differential item functioning (DIF) in which it is assumed that the MH statistics are normally distributed and that the prior distribution of underlying DIF parameters is also normal. (Author/SLD)

Descriptors: Bayesian Statistics, Item Bias, Statistical Distributions, Test Items

Publication Type: Journal Articles; Reports - Evaluative

Education Level: N/A

Audience: N/A

Language: English

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Authoring Institution: N/A

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Author Affiliations: N/A