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Jin, Kuan-Yu; Wang, Wen-Chung – Journal of Educational Measurement, 2014
Sometimes, test-takers may not be able to attempt all items to the best of their ability (with full effort) due to personal factors (e.g., low motivation) or testing conditions (e.g., time limit), resulting in poor performances on certain items, especially those located toward the end of a test. Standard item response theory (IRT) models fail to…
Descriptors: Student Evaluation, Item Response Theory, Models, Simulation
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Huang, Hung-Yu; Wang, Wen-Chung – Educational and Psychological Measurement, 2013
Both testlet design and hierarchical latent traits are fairly common in educational and psychological measurements. This study aimed to develop a new class of higher order testlet response models that consider both local item dependence within testlets and a hierarchy of latent traits. Due to high dimensionality, the authors adopted the Bayesian…
Descriptors: Item Response Theory, Models, Bayesian Statistics, Computation