Adjusting NAEP for Self-Selection: A Useful Place for "Wall Chart" Technology?.

Wainer, Howard

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Peer reviewed

ERIC Number: EJ411229

Record Type: Journal

Publication Date: 1990

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Adjusting NAEP for Self-Selection: A Useful Place for "Wall Chart" Technology?

Wainer, Howard

Journal of Educational Statistics, v15 n1 p1-7 Spr 1990

It is suggested that some of the technology applied to state Scholastic Aptitude Test scores to measure states' educational performance (particularly use of a truncated Gaussian model) may make it possible to adjust National Assessment of Educational Progress (NAEP) scores to make inferences about state educational progress possible. (SLD)

Descriptors: Academic Achievement, Educational Assessment, Elementary Secondary Education, Mathematical Models, State Norms, State Programs, State Surveys, Statistical Bias, Test Bias, Testing Programs

Publication Type: Journal Articles; Opinion Papers; Reports - Evaluative

Education Level: N/A

Audience: N/A

Language: English

Sponsor: N/A

Authoring Institution: N/A

Identifiers - Assessments and Surveys: National Assessment of Educational Progress; SAT (College Admission Test)

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Author Affiliations: N/A