Confidence envelopes for one-parameter, two-parameter, and three-parameter logistic item response models are illustrated. M-line plots showing the genesis of the envelope and the density of lines in the confidence region are described and illustrated. (Author/SLD)

A statistical method is described and illustrated which provides confidence envelopes around item response functions. Examples of 95 percent confidence envelopes for the one-, two-, and three-parameter logistic response models are given. In addition, the authors describe N-line plots, which show the genesis of the envelope as well as the density…

A testlet is an integrated group of test items presented as a unit. The concept of testlet differential item functioning (testlet DIF) is defined, and a statistical method is presented to detect testlet DIF. Data from a testlet-based experimental version of the Scholastic Aptitude Test illustrate the methodology. (SLD)