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| Reckase, Mark D. | 2 |
| Patience, Wayne M. | 1 |
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| Reports - Research | 1 |
| Speeches/Meeting Papers | 1 |
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Reckase, Mark D. – 1974
An application of the two-paramenter logistic (Rasch) model to tailored testing is presented. The model is discussed along with the maximum likelihood estimation of the ability parameters given the response pattern and easiness parameter estimates for the items. The technique has been programmed for use with an interactive computer terminal. Use…
Descriptors: Ability, Adaptive Testing, Computer Assisted Instruction, Difficulty Level
Patience, Wayne M.; Reckase, Mark D. – 1979
An experiment was performed with computer-generated data to investigate some of the operational characteristics of tailored testing as they are related to various provisions of the computer program and item pool. With respect to the computer program, two characteristics were varied: the size of the step of increase or decrease in item difficulty…
Descriptors: Adaptive Testing, Computer Assisted Testing, Difficulty Level, Error of Measurement


