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Application of Latent Trait Models to the Development of Norm-Referenced and Criterion-Referenced Tests.
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Cook, Linda L.; Hambleton, Ronald K. – 1978
Latent trait models may offer considerable potential for the improvement of educational measurement practices, but until recently, they have received only limited attention from measurement specialists. This paper provides a brief introduction to latent trait models, and provides test practitioners with a non-technical introduction to the…
Descriptors: Career Development, Criterion Referenced Tests, Difficulty Level, Item Analysis