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Wilson, Mark; Wright, Benjamin D. – 1983
A common problem in practical educational research is that of perfect scores which result when latent trait models are used. A simple procedure for managing the perfect and zero response problem encountered in converting test scores into measures is presented. It allows the test user to chose among two or three reasonable finite representations of…
Descriptors: Factor Analysis, Item Analysis, Latent Trait Theory, Mathematical Models
Peer reviewed Peer reviewed
Beuk, Cees H. – Journal of Educational Measurement, 1984
A systematic method for compromise between absolute and relative examination standards is proposed. The passing score is assumed to be related to expected pass rate through a simple linear function. Results define a function relating the percentage of successful candidates given a specified passing score to the passing score. (Author/DWH)
Descriptors: Achievement Tests, Cutting Scores, Foreign Countries, Mathematical Models
Reckase, Mark D.; And Others – 1985
Factor analysis is the traditional method for studying the dimensionality of test data. However, under common conditions, the factor analysis of tetrachoric correlations does not recover the underlying structure of dichotomous data. The purpose of this paper is to demonstrate that the factor analyses of tetrachoric correlations is unlikely to…
Descriptors: Correlation, Difficulty Level, Factor Analysis, Item Analysis
Drasgow, Fritz; Parsons, Charles K. – 1982
The effects of a multidimensional latent trait space on estimation of item and person parameters by the computer program LOGIST are examined. Several item pools were simulated that ranged from truly unidimensional to an inconsequential general latent trait. Item pools with intermediate levels of prepotency of the general latent trait were also…
Descriptors: Computer Simulation, Computer Software, Difficulty Level, Item Analysis
Livingston, Samuel A. – 1986
This paper deals with test fairness regarding a test consisting of two parts: (1) a "common" section, taken by all students; and (2) a "variable" section, in which some students may answer a different set of questions from other students. For example, a test taken by several thousand students each year contains a common multiple-choice portion and…
Descriptors: Difficulty Level, Error of Measurement, Essay Tests, Mathematical Models
Jones, Douglas H.; And Others – 1984
How accurately ability is estimated when the test model does not fit the data is considered. To address this question, this study investigated the accuracy of the maximum likelihood estimator of ability for the one-, two- and three-parameter logistic (PL) models. The models were fitted into generated item characteristic curves derived from the…
Descriptors: Ability, Aptitude Tests, Error of Measurement, Estimation (Mathematics)
Reckase, Mark D. – 1985
Multidimensional item difficulty (MID) is proposed as a means of describing test items which measure more than one ability. With mathematical story problems, for instance, both mathematical and verbal skills are required to obtain a correct answer. The proposed measure of MID is based upon three general assumptions: (1) the probability of…
Descriptors: Ability Identification, College Entrance Examinations, College Mathematics, Difficulty Level
Levine, Michael V.; Drasgow, Fritz – 1984
Some examinees' test-taking behavior may be so idiosyncratic that their scores are not comparable to the scores of more typical examinees. Appropriateness indices, which provide quantitative measures of response-pattern atypicality, can be viewed as statistics for testing a null hypothesis of normal test-taking behavior against an alternative…
Descriptors: Cheating, College Entrance Examinations, Computer Simulation, Estimation (Mathematics)
Legg, Sue M.; Algina, James – 1986
This paper focuses on the questions which arise as test practitioners monitor score scales derived from latent trait theory. Large scale assessment programs are dynamic and constantly challenge the assumptions and limits of latent trait models. Even though testing programs evolve, test scores must remain reliable indicators of progress.…
Descriptors: Difficulty Level, Educational Assessment, Elementary Secondary Education, Equated Scores
Waller, Michael I. – 1986
This study compares the fit of the 3-parameter model to the Ability Removing Random Guessing (ARRG) model on data from a wide range of tests of cognitive ability in three representative samples. When the guessing parameters under the 3-parameter model are estimated individually for each item, the 3-parameter model yields the better fit to…
Descriptors: Cognitive Tests, Cohort Analysis, Elementary Secondary Education, Equations (Mathematics)
Eads, Gerald M., II; And Others – 1986
The purpose of this research was to develop and test a method of identifying groups of students participating in a mandated statewide norm-referenced testing program who have undergone highly specific training in preparation for, or coaching during, test administration. The implementation of the analysis procedure was intended not only to identify…
Descriptors: Elementary Secondary Education, Goodness of Fit, Grade 11, Grade 4
Ingebo, George S. – 1987
Greater knowledge about the practical application of Rasch technology can help in avoiding misapplications and confusions in testing programs. Equal interval curriculum-based scaling makes possible the following improvements in measuring basic skills achievement by enabling testing programs to: (1) individualize the difficulty level of…
Descriptors: Achievement Rating, Achievement Tests, Basic Skills, Difficulty Level
DeMauro, Gerald E. – 1985
The Language Assessment Battery was administered to third to fifth grade limited English speaking students in New York City. Special techniques addressed two common problems in testing these populations: (1) language tests suitable for limited English speakers change their psychometric characteristics over time as the students' language ability…
Descriptors: Achievement Gains, Bilingual Education Programs, Cutting Scores, Elementary Education