Corrected Estimates of WAIS-R Short Form Reliability and Standard Error of Measurement.

Axelrod, Bradley N.; And Others

Notes FAQ Contact Us

Back to results

Peer reviewed

ERIC Number: EJ531732

Record Type: Journal

Publication Date: 1996

Pages: N/A

Abstractor: N/A

ISBN: N/A

ISSN: ISSN-1040-3590

EISSN: N/A

Available Date: N/A

Corrected Estimates of WAIS-R Short Form Reliability and Standard Error of Measurement.

Axelrod, Bradley N.; And Others

Psychological Assessment, v8 n2 p222-23 Jun 1996

The calculations of D. Schretlen, R. H. B. Benedict, and J. H. Bobholz for the reliabilities of a short form of the Wechsler Adult Intelligence Scale--Revised (WAIS-R) (1994) consistently overestimated the values. More accurate values are provided for the WAIS--R and a seven-subtest short form. (SLD)

Descriptors: Error Correction, Error of Measurement, Estimation (Mathematics), Intelligence Tests, Test Format, Test Length, Test Reliability

Publication Type: Reports - Evaluative; Journal Articles

Education Level: N/A

Audience: N/A

Language: English

Sponsor: N/A

Authoring Institution: N/A

Identifiers - Assessments and Surveys: Wechsler Adult Intelligence Scale

Grant or Contract Numbers: N/A

Author Affiliations: N/A