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ERIC Number: EJ1182259
Record Type: Journal
Publication Date: 2016
Pages: 23
Abstractor: As Provided
ISBN: N/A
ISSN: EISSN-2196-0739
EISSN: N/A
Available Date: N/A
Assessment of Fit of Item Response Theory Models Used in Large-Scale Educational Survey Assessments
van Rijn, Peter W.; Sinharay, Sandip; Haberman, Shelby J.; Johnson, Matthew S.
Large-scale Assessments in Education, v4 Article 10 2016
Latent regression models are used for score-reporting purposes in large-scale educational survey assessments such as the National Assessment of Educational Progress (NAEP) and Trends in International Mathematics and Science Study (TIMSS). One component of these models is based on item response theory. While there exists some research on assessment of fit of item response theory models in the context of large-scale assessments, there is a scope of further research on the topic. We suggest two types of residuals to assess the fit of item response theory models in the context of large-scale assessments. The Type I error rates and power of the residuals are computed from simulated data. The residuals are computed using data from four NAEP assessments. Misfit was found for all data sets for both types of residuals, but the practical significance of the misfit was minimal.
Springer. Available from: Springer Nature. 233 Spring Street, New York, NY 10013. Tel: 800-777-4643; Tel: 212-460-1500; Fax: 212-348-4505; e-mail: customerservice@springernature.com; Web site: https://link-springer-com.bibliotheek.ehb.be/
Publication Type: Journal Articles; Reports - Research
Education Level: Elementary Secondary Education
Audience: N/A
Language: English
Sponsor: Institute of Education Sciences (ED)
Authoring Institution: N/A
Identifiers - Assessments and Surveys: National Assessment of Educational Progress; Trends in International Mathematics and Science Study
IES Funded: Yes
Grant or Contract Numbers: R305D120006
Author Affiliations: N/A