Publication Date
In 2025 | 0 |
Since 2024 | 0 |
Since 2021 (last 5 years) | 0 |
Since 2016 (last 10 years) | 1 |
Since 2006 (last 20 years) | 1 |
Descriptor
Source
Large-scale Assessments in… | 1 |
Author
Haberman, Shelby J. | 1 |
Johnson, Matthew S. | 1 |
Sinharay, Sandip | 1 |
van Rijn, Peter W. | 1 |
Publication Type
Journal Articles | 1 |
Reports - Research | 1 |
Education Level
Elementary Secondary Education | 1 |
Audience
Location
Laws, Policies, & Programs
Assessments and Surveys
National Assessment of… | 1 |
Trends in International… | 1 |
What Works Clearinghouse Rating
van Rijn, Peter W.; Sinharay, Sandip; Haberman, Shelby J.; Johnson, Matthew S. – Large-scale Assessments in Education, 2016
Latent regression models are used for score-reporting purposes in large-scale educational survey assessments such as the National Assessment of Educational Progress (NAEP) and Trends in International Mathematics and Science Study (TIMSS). One component of these models is based on item response theory. While there exists some research on assessment…
Descriptors: Goodness of Fit, Item Response Theory, Regression (Statistics), National Competency Tests