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| Adaptive Testing | 1 |
| Computer Assisted Testing | 1 |
| Elementary Secondary Education | 1 |
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| Applied Psychological… | 1 |
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| Cudeck, Robert | 1 |
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| Stanford Binet Intelligence… | 1 |
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Peer reviewedCudeck, Robert; And Others – Applied Psychological Measurement, 1980
Tailored testing by Cliff's method of implied orders was simulated through the use of responses gathered during conventional administration of the Stanford-Binet Intelligence Scale. Tailoring eliminated approximately half the responses with only modest decreases in score reliability. (Author/BW)
Descriptors: Adaptive Testing, Computer Assisted Testing, Elementary Secondary Education, Intelligence Tests
