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Harrison, Scott; Kroehne, Ulf; Goldhammer, Frank; Lüdtke, Oliver; Robitzsch, Alexander – Large-scale Assessments in Education, 2023
Background: Mode effects, the variations in item and scale properties attributed to the mode of test administration (paper vs. computer), have stimulated research around test equivalence and trend estimation in PISA. The PISA assessment framework provides the backbone to the interpretation of the results of the PISA test scores. However, an…
Descriptors: Scoring, Test Items, Difficulty Level, Foreign Countries
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Güler, Mustafa – Journal of Pedagogical Research, 2021
The extent to which the targeted outcomes in education are achieved can be determined by the educational assessment process. Although various alternative ways of assessment have arisen in recent decades, written examinations are still widely used by teachers. This study aims to determine the quality of the questions used by middle school…
Descriptors: Middle School Teachers, Mathematics Teachers, Middle School Mathematics, Mathematics Tests
Lina Anaya; Nagore Iriberri; Pedro Rey-Biel; Gema Zamarro – Annenberg Institute for School Reform at Brown University, 2021
Standardized assessments are widely used to determine access to educational resources with important consequences for later economic outcomes in life. However, many design features of the tests themselves may lead to psychological reactions influencing performance. In particular, the level of difficulty of the earlier questions in a test may…
Descriptors: Test Construction, Test Wiseness, Test Items, Difficulty Level
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Debeer, Dries; Janssen, Rianne – Journal of Educational Measurement, 2013
Changing the order of items between alternate test forms to prevent copying and to enhance test security is a common practice in achievement testing. However, these changes in item order may affect item and test characteristics. Several procedures have been proposed for studying these item-order effects. The present study explores the use of…
Descriptors: Item Response Theory, Test Items, Test Format, Models