Publication Date
| In 2026 | 0 |
| Since 2025 | 0 |
| Since 2022 (last 5 years) | 0 |
| Since 2017 (last 10 years) | 0 |
| Since 2007 (last 20 years) | 2 |
Descriptor
| Regression (Statistics) | 2 |
| Achievement | 1 |
| Background | 1 |
| Classification | 1 |
| Computation | 1 |
| English | 1 |
| Error of Measurement | 1 |
| Expertise | 1 |
| Foreign Countries | 1 |
| Grade 8 | 1 |
| International Assessment | 1 |
| More ▼ | |
Source
| Applied Measurement in… | 2 |
Author
| Benítez, Isabel | 1 |
| Hidalgo Montesinos, María… | 1 |
| Padilla, José-Luis | 1 |
| Rutkowski, Leslie | 1 |
| Sireci, Stephen G. | 1 |
Publication Type
| Journal Articles | 2 |
| Reports - Research | 2 |
| Tests/Questionnaires | 1 |
Education Level
| Grade 8 | 1 |
| Junior High Schools | 1 |
| Middle Schools | 1 |
| Secondary Education | 1 |
Audience
Location
| Spain | 1 |
| United States | 1 |
Laws, Policies, & Programs
Assessments and Surveys
| Program for International… | 2 |
| National Assessment of… | 1 |
| Progress in International… | 1 |
| Trends in International… | 1 |
What Works Clearinghouse Rating
Peer reviewed
Direct linkBenítez, Isabel; Padilla, José-Luis; Hidalgo Montesinos, María Dolores; Sireci, Stephen G. – Applied Measurement in Education, 2016
Analysis of differential item functioning (DIF) is often used to determine if cross-lingual assessments are equivalent across languages. However, evidence on the causes of cross-lingual DIF is still evasive. Expert appraisal is a qualitative method useful for obtaining detailed information about problematic elements in the different linguistic…
Descriptors: Test Bias, Mixed Methods Research, Questionnaires, International Assessment
Rutkowski, Leslie – Applied Measurement in Education, 2014
Large-scale assessment programs such as the National Assessment of Educational Progress (NAEP), Trends in International Mathematics and Science Study (TIMSS), and Programme for International Student Assessment (PISA) use a sophisticated assessment administration design called matrix sampling that minimizes the testing burden on individual…
Descriptors: Measurement, Testing, Item Sampling, Computation
