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Andreas Frey; Christoph König; Aron Fink – Journal of Educational Measurement, 2025
The highly adaptive testing (HAT) design is introduced as an alternative test design for the Programme for International Student Assessment (PISA). The principle of HAT is to be as adaptive as possible when selecting items while accounting for PISA's nonstatistical constraints and addressing issues concerning PISA such as item position effects.…
Descriptors: Adaptive Testing, Test Construction, Alternative Assessment, Achievement Tests