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Patel, Nirmal; Sharma, Aditya; Shah, Tirth; Lomas, Derek – Journal of Educational Data Mining, 2021
Process Analysis is an emerging approach to discover meaningful knowledge from temporal educational data. The study presented in this paper shows how we used Process Analysis methods on the National Assessment of Educational Progress (NAEP) test data for modeling and predicting student test-taking behavior. Our process-oriented data exploration…
Descriptors: Learning Analytics, National Competency Tests, Evaluation Methods, Prediction
Jing Lu; Chun Wang; Ningzhong Shi – Grantee Submission, 2023
In high-stakes, large-scale, standardized tests with certain time limits, examinees are likely to engage in either one of the three types of behavior (e.g., van der Linden & Guo, 2008; Wang & Xu, 2015): solution behavior, rapid guessing behavior, and cheating behavior. Oftentimes examinees do not always solve all items due to various…
Descriptors: High Stakes Tests, Standardized Tests, Guessing (Tests), Cheating
Li, Deping; Oranje, Andreas – ETS Research Report Series, 2007
Two versions of a general method for approximating standard error of regression effect estimates within an IRT-based latent regression model are compared. The general method is based on Binder's (1983) approach, accounting for complex samples and finite populations by Taylor series linearization. In contrast, the current National Assessment of…
Descriptors: Error of Measurement, Regression (Statistics), Trend Analysis, National Competency Tests
Romberg, Thomas A.; And Others – 1982
Procedural documentation is presented for administering, scoring and analyzing data gathered to examine the construct validity of a set of superitems developed to assess student levels of mathematical reasoning ability. Each superitem includes a mathematical situation and a structured set of questions about that situation. The questions were based…
Descriptors: Cognitive Processes, Elementary Secondary Education, Item Analysis, Mathematics Achievement
Xu, Xueli; von Davier, Matthias – ETS Research Report Series, 2006
More than a dozen statistical models have been developed for the purpose of cognitive diagnosis. These models are supposed to extract a much finer level of information from item responses than traditional unidimensional item response models. In this paper, a general diagnostic model (GDM) was used to analyze a set of simulated sparse data and real…
Descriptors: Statistical Analysis, National Competency Tests, Diagnostic Tests, Item Response Theory