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No-Show Analysis. Final Report.
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Kalsbeek, William D.; And Others – 1975
The National Assessment of Educational Progress; Second Science Assessment No-Show Study assessed the magnitude and causation of nonresponse biases. A No-Show is defined as an individual who was selected as a sample respondent but failed to be present for regular assessment of the 17-year-old group. The procedure whereby a sample of eligible…
Descriptors: Educational Assessment, High Schools, Mathematical Models, Performance Factors
Considerations and Techniques for the Analysis of NAEP Data.
Peer reviewed Peer reviewed
Johnson, Eugene G. – Journal of Educational Statistics, 1989
The effects of certain characteristics (e.g., sample design) of National Assessment of Educational Progress (NAEP) data on statistical analysis techniques are considered. Ignoring special features of NAEP data and proceeding with a standard analysis can produce inferences that underestimate the true variability and overestimate the true degrees of…
Descriptors: Data Collection, Educational Assessment, Elementary Secondary Education, Estimation (Mathematics)
A Latent Trait Model for Interpreting Misconceptions in Procedural Domains.
Tatsuoka, Kikumi K. – 1982
This study introduced a probabilistic model utilizing item response theory (IRT) for dealing with a variety of misconceptions. The model can be used for evaluating the transition behavior of error types, advancement of learning stages, or the stability and persistence of particular misconceptions. Moreover, it apparently can be used for relating…
Descriptors: Adaptive Testing, Elementary Secondary Education, Error Patterns, Evaluation Methods
Using Residual Analyses to Assess Item Response Model-Test Data Fit. Laboratory of Psychometric and Evaluative Research Report No. 140.
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Murray, Linda N.; Hambleton, Ronald K. – 1983
The purpose of this research study was to assess item response model-test data fit using residuals. First, a comparison of raw and standardized residuals for describing model-test data fit was carried out. Second, hypotheses concerning the relationship between residual sizes and several item characteristics were studied. The analyses with…
Descriptors: Educational Assessment, Goodness of Fit, Item Analysis, Latent Trait Theory
Issues and Procedures in Analyzing the State Assessment Data.
Johnson, Eugene – 1989
The 1990 National Assessment of Educational Progress (NAEP) will mark the first time that state-level comparisons will be possible with NAEP data. The 1990 data will contain, as a trial component, state-level assessments of eighth graders in mathematics. Mathematics and reading comparisons for fourth graders will be added in 1992. Statistical…
Descriptors: Achievement Tests, Demography, Elementary Education, Elementary School Students
An Item Response Model for the Estimation of Demographic Effects.
Peer reviewed Peer reviewed
Reiser, Mark – Journal of Educational Statistics, 1983
In studies involving matrix sampling on items, it is often the case that there are too few responses per individual to use latent trait item response models. A model is formulated wherein individual level variability appears as independent error within the cells of a cross classification of demographic variables. (JKS)
Descriptors: Achievement Tests, Demography, Educational Assessment, Estimation (Mathematics)