NotesFAQContact Us
Collection
Advanced
Search Tips
Publication Date
In 20250
Since 20240
Since 2021 (last 5 years)0
Since 2016 (last 10 years)1
Since 2006 (last 20 years)3
Descriptor
Elementary Secondary Education3
Error Patterns3
Census Figures2
College Entrance Examinations2
Data Analysis2
Data Collection2
Definitions2
Early Childhood Education2
Educational Indicators2
Educational Legislation2
Educational Research2
Federal Legislation2
Funding Formulas2
Higher Education2
Library Research2
Longitudinal Studies2
Performance Factors2
Sampling2
School Statistics2
Statistical Analysis2
Surveys2
Tables (Data)2
Achievement Tests1
Annual Reports1
Case Records1
More ▼
Source
National Center for Education…2
Large-scale Assessments in…1
Author
Dillow, Sally A.2
Snyder, Thomas D.2
Haberman, Shelby J.1
Johnson, Matthew S.1
Sinharay, Sandip1
van Rijn, Peter W.1
Publication Type
Reference Materials - General2
Reports - Descriptive2
Journal Articles1
Reports - Research1
Education Level
Elementary Secondary Education3
Early Childhood Education2
Elementary Education2
Higher Education2
Postsecondary Education2
Secondary Education2
Adult Education1
Audience
Location
Laws, Policies, & Programs
Individuals with Disabilities…2
No Child Left Behind Act 20011
Assessments and Surveys
National Assessment of…3
Trends in International…3
ACT Assessment2
Baccalaureate and Beyond…2
Early Childhood Longitudinal…2
Fast Response Survey System2
General Educational…2
Graduate Record Examinations2
National Adult Literacy…2
National Assessment of Adult…2
National Household Education…2
Program for International…2
SAT (College Admission Test)2
Schools and Staffing Survey…2
Youth Risk Behavior Survey2
National Health Interview…1
National Public Education…1
Progress in International…1
More ▼
What Works Clearinghouse Rating
Showing all 3 results Save | Export
Assessment of Fit of Item Response Theory Models Used in Large-Scale Educational Survey Assessments
Peer reviewed Peer reviewed
Direct linkDirect link
van Rijn, Peter W.; Sinharay, Sandip; Haberman, Shelby J.; Johnson, Matthew S. – Large-scale Assessments in Education, 2016
Latent regression models are used for score-reporting purposes in large-scale educational survey assessments such as the National Assessment of Educational Progress (NAEP) and Trends in International Mathematics and Science Study (TIMSS). One component of these models is based on item response theory. While there exists some research on assessment…
Descriptors: Goodness of Fit, Item Response Theory, Regression (Statistics), National Competency Tests
Digest of Education Statistics, 2012. NCES 2014-015 [Appendix A: Guide to Sources; Appendix B: Definitions; Appendix C: Index of Table Numbers]
Peer reviewed Peer reviewed
PDF on ERIC Download full text
Snyder, Thomas D.; Dillow, Sally A. – National Center for Education Statistics, 2013
The 2012 edition of the "Digest of Education Statistics" is the 48th in a series of publications initiated in 1962. The "Digest" has been issued annually except for combined editions for the years 1977-78, 1983-84, and 1985-86. Its primary purpose is to provide a compilation of statistical information covering the broad field…
Descriptors: School Statistics, Definitions, Tables (Data), Longitudinal Studies
Digest of Education Statistics, 2011. NCES 2012-001 [Appendix A: Guide to Sources; Appendix B: Definitions; Appendix C: Index of Table Numbers]
Peer reviewed Peer reviewed
PDF on ERIC Download full text
Snyder, Thomas D.; Dillow, Sally A. – National Center for Education Statistics, 2012
The 2011 edition of the "Digest of Education Statistics" is the 47th in a series of publications initiated in 1962. The "Digest" has been issued annually except for combined editions for the years 1977-78, 1983-84, and 1985-86. Its primary purpose is to provide a compilation of statistical information covering the broad field…
Descriptors: Educational Research, Data Collection, Data Analysis, Error Patterns