Descriptor
| Comparative Testing | 1 |
| Intelligence Tests | 1 |
| Low Ability Students | 1 |
| Mental Retardation | 1 |
| Reading Tests | 1 |
| Test Validity | 1 |
Author
| Halloran, William | 1 |
| Hull, Marc | 1 |
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| General Aptitude Test Battery | 1 |
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Peer reviewedHull, Marc; Halloran, William – Educational and Psychological Measurement, 1976
Results show that the mean number of Occupational Aptitude Patterns (OAP's) generated for a sample of mentally retarded and boarderline intelligence students is significantly greater for the Nonreading Aptitude Test Battery (NATB) than for the General Aptitude Test Battery (GATB). (DEP)
Descriptors: Comparative Testing, Intelligence Tests, Low Ability Students, Mental Retardation


