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Yen, Wendy M. – 1979
Three test-analysis models were used to analyze three types of simulated test score data plus the results of eight achievement tests. Chi-square goodness-of-fit statistics were used to evaluate the appropriateness of the models to the four kinds of data. Data were generated to simulate the responses of 1,000 students to 36 pseudo-items by…
Descriptors: Achievement Tests, Correlation, Goodness of Fit, Item Analysis
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Yen, Wendy M. – Journal of Educational Measurement, 1993
Results from the Maryland School Performance Assessment Program for 5,392 elementary school students and from the Comprehensive Tests of Basic Skills (multiple choice) for a national sample are used to explore local item independence (LID) of test items. Some strategies are suggested for measuring LID in performance assessments. (SLD)
Descriptors: Educational Assessment, Elementary Education, Elementary School Students, Equations (Mathematics)