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van Rijn, Peter W.; Sinharay, Sandip; Haberman, Shelby J.; Johnson, Matthew S. – Large-scale Assessments in Education, 2016
Latent regression models are used for score-reporting purposes in large-scale educational survey assessments such as the National Assessment of Educational Progress (NAEP) and Trends in International Mathematics and Science Study (TIMSS). One component of these models is based on item response theory. While there exists some research on assessment…
Descriptors: Goodness of Fit, Item Response Theory, Regression (Statistics), National Competency Tests

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